ES-SXR
High-resolution VLS soft x-ray / EUV flat-field spectrograph.
Resolving power up to ~ 2,000 over a wavelength range ~ 0.6 – 50 nm
or ~ 0.6 – 200 nm, depending on grating complement.
Effective reflection graze angle ~ 2.00 degrees.
ES-SXRHigh-resolution VLS soft x-ray / EUV flat-field spectrograph.
Resolving power up to ~ 2,000 over a wavelength range ~ 0.6 – 50 nm
or ~ 0.6 – 200 nm, depending on grating complement.
Effective reflection graze angle ~ 2.00 degrees.