High-resolution VLS soft x-ray / EUV flat-field spectrograph.
Resolving power up to ~ 2,000 over a wavelength range ~ 0.6 – 50 nm
or ~ 0.6 – 200 nm, depending on grating complement.
Effective reflection graze angle ~ 2.00 degrees.
Ultra-high resolution VLS flat-field spectrograph.
Resolving power up to ~ 20,000 over a wavelength range ~ 1.7 – 30 nm.
Effective reflection graze angle ~ 4.75 degrees.
High-throughput soft x-ray stationary-slit monochromator.
Resolving power ~ 100 over a scanning range ~ 0.6 nm – 10 nm.
Effective reflection graze angle ~ 2.25 degrees.
Expedite “first-light” through the spectrometer in the end-to-end configuration, instruct user on operation and provide advice for system improvement.
On-site fine tuning of the user’s source and detector interfaces to optimize performance (spectral resolution, throughput, etc.)
Perform absolute wavelength calibration of experimentally-obtained spectra.